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A Thorough Evaluation of GaN HEMT Degradation under Realistic Power Amplifier Operation
Bosi, G.; Raffo, A.; Vadala, V.; Giofre, R.; Crupi, G.; Vannini, G.
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Contributo in rivista (Pubblicazione in Rivista) |
ELECTRONICS
Vol. 12, No. 13, pp: 2939-2956, Anno: 2023 |
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Active Balun Design for Next-Generation Telecom Satellite Frequency Converters
Resca, D.; Bosi, G.; Biondi, A.; Cariani, L.; Vadala, V.; Scappaviva, F.; Raffo, A.; Vannini, G.
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Contributo in rivista (Pubblicazione in Rivista) |
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
Vol. 33, No. 2, pp: 165-168, Anno: 2023 |
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A Systematic and Numerical Methodology for GaN HEMT Current-Gain Peak Analysis Using the Complex Lorentzian Function
Gugliandolo, G; Crupi, G; Vadala, V; Raffo, A; Donato, N; Vannini, G
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Contributo in rivista (Pubblicazione in Rivista) |
IEEE MICROWAVE AND WIRELESS TECHNOLOGY LETTERS
Vol. 33, No. 7, pp: 1007-1010, Anno: 2023 |
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mm-Wave GaN HEMT Technology: Advances, Experiments, and Analysis
Vadala, V.; Crupi, G.; Giofre, R.; Bosi, G.; Raffo, A.; Vannini, G.
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Atto di Convegno (Proceedings) |
IEEE Computer Society,
Mediterranean Microwave Symposium
Vol. 2022-, No. 1, pp: 420-425, Anno: 2022 |
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Advances in Ku-Band GaN Single Chip Front End for Space SARs: From System Specifications to Technology Selection
Scappaviva, F.; Bosi, G.; Biondi, A.; D'Angelo, S.; Cariani, L.; Vadala, V.; Raffo, A.; Resca, D.; Cipriani, E.; Vannini, G.
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Contributo in rivista (Pubblicazione in Rivista) |
ELECTRONICS
Vol. 11, No. 19, pp: 2998-3007, Anno: 2022 |
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Analysis of Efficiency-Limiting Factors Resulting from Transistor Current Source on Class-F and Inverse Class-F Power Amplifiers
Yamamoto, H.; Kikuchi, K.; Vadala, V.; Bosi, G.; Raffo, A.; Vannini, G.
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Contributo in rivista (Pubblicazione in Rivista) |
IEICE TRANSACTIONS ON ELECTRONICS
Vol. E105C, No. 10, pp: 449-456, Anno: 2022 |
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150-nm GaN HEMT Degradation under Realistic Load-Line Operation
Raffo, A.; Vadala, V.; Bosi, G.; Giofre, R.; Vannini, G.
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Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
2022 17th European Microwave Integrated Circuits Conference, EuMIC 2022
pp: 141-144, Anno: 2022 |
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Equivalent-circuit extraction for gallium nitride electron devices: Direct versus optimization-empowered approaches
Jarndal, A.; Crupi, G.; Alim, M. A.; Vadala, V.; Raffo, A.; Vannini, G.
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Contributo in rivista (Pubblicazione in Rivista) |
INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS
Vol. 35, No. 5, pp: e3008-1-e3008-11, Anno: 2022 |
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200-W GaN PA Design Based on Accurate Multicell Transistor Modeling
Vadala, V.; Raffo, A.; Bosi, G.; Barsegyan, A.; Custer, J.; Formicone, G.; Walker, J.; Vannini, G.
details >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
IEEE MTT-S International Microwave Symposium Digest
Vol. 2022-, No. 1, pp: 378-381, Anno: 2022 |
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Advanced Measurement Techniques for Nonlinear Modelling of GaN HEMTs: From L-band to mm-Wave Applications
Vadalà, Valeria; Raffo, A.; Bosi, Gianni; Giofrè, Rocco; Vannini, Giorgio
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Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
2021 15th International Conference on Advanced Technologies, Systems and Services in Telecommunications, TELSIKS 2021 - Proceedings
pp: 63-69, Anno: 2021 |
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Empowering GaN-Si HEMT Nonlinear Modelling for Doherty Power Amplifier Design
Bosi, G.; Raffo, A.; Giofre, R.; Vadala, Valeria; Vannini, G.; Limiti, E.
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Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
EuMIC 2020 - 2020 15th European Microwave Integrated Circuits Conference
pp: 249-252, Anno: 2021 |
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Advanced Modelling Techniques Enabling E-Band Power Amplifier Design for 5G Backhauling
Vadala, V.; Raffo, A.; Colzani, A.; Fumagalli, M. A.; Sivverini, G.; Bosi, G.; Vannini, G.
details >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
EuMIC 2020 - 2020 15th European Microwave Integrated Circuits Conference
pp: 161-164, Anno: 2021 |
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An Improved Transistor Modeling Methodology Exploiting the Quasi-Static Approximation
Jarndal, A.; Crupi, G.; Raffo, A.; Vadala', V.; Vannini, G.
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Contributo in rivista (Pubblicazione in Rivista) |
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
Vol. 9, No. 1, pp: 378-386, Anno: 2021 |
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Evaluation of Microwave Transistor Degradation Using Low-Frequency Time-Domain Measurements
Bosi, G.; Vadala', V.; Giofre, R.; Raffo, A.; Vannini, G.
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Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
2021 34th General Assembly and Scientific Symposium of the International Union of Radio Science, URSI GASS 2021
pp: 01-03, Anno: 2021 |
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Load-Pull Measurements Oriented to Harmonically-Tuned Power Amplifier Design
Bosi, Gianni; Raffo, Antonio; Vadalà, Valeria; Vannini, Giorgio; Avolio, Gustavo; Marchetti, Mauro; Giofre', Rocco; Colantonio, Paolo; Limiti, Ernesto
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Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
2020 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMiC) - Proceedings
pp: 9160151-1-9160151-3, Anno: 2020 |
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Nonlinear Characterization of GaN Transistors under Dynamic Bias Operation
Vadalà, Valeria; Vannini, G.
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Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
2020 33rd General Assembly and Scientific Symposium of the International Union of Radio Science, URSI GASS 2020
pp: 9232254-1-9232254-3, Anno: 2020 |
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A New Modeling Technique for Microwave Multicell Transistors Based on EM Simulations
Raffo, A.; Vadala, V.; Yamamoto, H.; Kikuchi, K.; Bosi, G.; Ui, N.; Inoue, K.; Vannini, G.
details >>
Contributo in rivista (Pubblicazione in Rivista) |
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
Vol. 68, No. 7, pp: 3100-3110, Anno: 2020 |
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Scalability of Multifinger HEMT Performance
Crupi, G.; Raffo, A.; Vadala, Valeria; Vannini, G.; Schreurs, D. M. M. -P.; Caddemi, A.
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Contributo in rivista (Pubblicazione in Rivista) |
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
Vol. 30, No. 9, pp: 869-872, Anno: 2020 |
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GaN HEMT Model with Enhanced Accuracy under Back-off Operation
Vadala', Valeria; Raffo, Antonio; Kikuchi, Ken; Yamamoto, Hiroshi; Bosi, Gianni; Inoue, Kazutaka; Ui, Norihiko; Vannini, Giorgio
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Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
2019 14th European Microwave Integrated Circuits Conference (EuMIC)
pp: 37-40, Anno: 2019 |
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GaN FET Load-Pull Data in Circuit Simulators: a Comparative Study
Avolio, G.; Raffo, A.; Marchetti, M.; Bosi, G.; Vadalà, V.; Vannini, G.
details >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
2019 14th European Microwave Integrated Circuits Conference (EuMIC)
pp: 80-83, Anno: 2019 |
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